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By Bruce A. Tuttle, Chonglin Chen, Quanxi Jia, R. Ramesh

Advances in synthesis and characterization of dielectric, piezoelectric and ferroelectric skinny motion pictures are integrated during this quantity. Dielectric, piezoelectric and ferroelectric skinny motion pictures have a massive impression on various advertisement and armed forces platforms together with tunable microwave units, stories, MEMS units, actuators and sensors. contemporary paintings on piezoelectric characterization, AFE to FE dielectric part transformation dielectrics, answer and vapor deposited skinny motion pictures, and fabrics integration are one of the themes incorporated. Novel techniques to nanostructuring, characterization of fabric houses and actual responses on the nanoscale is also included.Content:

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P. Luo, C. W. Chu, F. A, Miranda, F. W. Van Keuls, J. C. I. Meletis, and H. Chang, Appl. Phys. , 78, 652 (2001). C. Jiang, Y. L. W. I. Meletis, J. Appl. , 91 3188 (2002). 17 H-J. Gao, C. L. Chen, B. J. P. W. Chu, Appl. Phys. , 75, 2542 (1999). Q. C. Jiang, W. Tian, Q. A. B. Eom, J. Appl. , 86 (1999) 4188. Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films • 49 Advanced Dielectric, Piezoelectric and Ferroelectric Thin Films Edited by Bruce A. Tuttle, Chonglin Chen, Quanxi Jia and R.

3,4,5 However, the issues of which site the excess Bi is incorporated and how excess Bi affects the orientation and polarization of BIT films are still unresolved. To resolve these questions, we investigated the effect of excess Bi on the crystal orientation and lattice dynamics of BIT films by x-ray diffraction (XRD), scanning electron microscopy (SEM) and Raman scattering. 5 The phase development and orientation of the films were studied using XRD &-20 scan. The surface morphology of samples was studied using SEM.

Shaw, C. Parks, J. Lian, H. Xu Q. Y. xSrxTi03/Pt thin film capacitors, J. Appl. Phys. vol. 89, pp. 2873-2885,2001. 5 K. Kurihara, T. Shioga, J. D. Baniecki, "Electrical properties of low-inductance barium strontium titanate thin film decoupling", Journal of the European Ceramic Society, 24 1873-1876 (2004). D. Baniecki, T. Shioga, K. Kurihara, N. Kamehara, "Investigation of the importance of interface and bulk limited transport mechanisms on the leakage current of high dielectric constant thin film capacitors", J.

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